Publikacje

  • Joanna Gurgurewicz, Daniel Mège, Marta Skiścim, Justyna Pers,Nanotopographic characterization of microfractures in rocks by Atomic Force Microscopy,Journal of Structural Geology 124 (2019) 70–80
  • Sylwia Bilińska, Karolina Idczak, Marta Skiścim, Leszek Markowski,Thin Pb films on the Si(111)-√7x√3-In reconstructed surfaces,Vacuum 122 (2015) 300-305
  • K. Idczak, P. Mazur, S. Zuber, L. Markowski, M. Skiścim, S. Bilińska,Growth of thin zirconium and zirconium oxides films on the n-GaN(0 0 0 1) surface studied by XPS and LEED.,Applied Surface Science 304 (2014) 29-34
  • Marta Skiścim, Sylwia Bilińska, Karolina Idczak, Leszek Markowski,Low coverage Si(1 1 1)√7 ×√3–In reconstruction: Deposition rate effect, Applied Surface Science 304 (2014) 103-106
  • K. Idczak, M. Skiścim, L. Markowski,Comparison of the adsorption of thin zirconium and titanium oxides films on the 6H-SiC(0001) surface ,Cryst. Res. Technol. 47, No. 3 (2012) 329 - 332.
  • Karolina Idczak, Piotr Mazur, Leszek Markowski, Marta Skiścim, M. Musiał,Growth of thin zirconium oxide films on the 6H-SiC(0001) surface.,Applied Surface Science 258 (2012) 8349-8353
  • Marta Skiścim, Karolina Idczak, Leszek Markowski,Badania układu cienkowarstwowego ZrOx na powierzchni 6H-SiC (0001) metodami LEED i XPS ,Elektronika 8 (2011)