dr Miłosz Grodzicki

Telefon: (71) 375 9259
Login: milosz.grodzicki
E-mail: login@ifd.uni.wroc.pl

Doktorat:



Data: June 18, 2010
Temat: Wzrost i morfologia warstw Cr na 6H-SiC(0001)
Osoba: mgr Miłosz Grodzicki
Promotor: prof. dr hab. Antoni Ciszewski

Publikacje

  • Justyna Pers, Miłosz Grodzicki, Antoni Ciszewski,Topography of thin films containing Ni-Ga intermetallic compounds formed on GaN(0001),Copernican Letters 7 (2016) 1-5
  • Justyna Pers, Bogdan Barwiński, Miłosz Grodzicki, Antoni Ciszewski,AFM studies of pits formation on KBr(100) during its dissolution by water,Materials Science-Poland 34(4) (2016) 863–867
  • Radosław Wasielewski, Piotr Mazur, Miłosz Grodzicki, Antoni Ciszewski,TiO thin films on GaN(0001),Physica Status Solidi B 252(5) (2015) 1001-1005
  • M. Grodzicki, P. Mazur, J. Pers, J. Brona, S. Zuber, A. Ciszewski,Formation of GaPd2 and GaPd intermetallic compounds on GaN(0001),Applied Physics A 120 (2015) 1443–1451
  • M. Grodzicki, P. Mazur, S. Zuber, J. Brona, A. Ciszewski,Oxidation of GaN(0001) by low-energy ion bombardment.,Applied Surface Science 304 (2014) 20–23
  • M. Grodzicki, P. Mazur, S. Zuber, J. Pers, J. Brona, A. Ciszewski,Effect of annealing on Ni/GaN(0 0 0 1) contact morphology,Applied Surface Science 304 (2014) 24-28
  • M. Grodzicki, P. Mazur, S. Zuber, J. Pers, A. Ciszewski,Pd/GaN(0001) interface properties,Materials Science-Poland 32(2) (2014) 252-256
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,AFM/STM Modification of Thin Sb Films on 6H-SiC(0001),Acta Physica Polonica A 126 (2014) 1131
  • M. Grodzicki, P. Mazur, J. Pers, S. Zuber, A. Ciszewski,Sb Layers on p-GaN:UPS, XPS and LEED Study, Acta Physica Polonica A 126 (2014) 1128
  • Miłosz Grodzicki, Szymon Adam,Wyznaczanie prędkości dźwięku w powietrzu przy użyciu karty muzycznej komputera,Aparatura Badawcza i Dydaktyczna 4 (2014) 333-340
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski ,TiO2 thin films grown on SiO2-Si(111) by the reactive evaporation method ,Optica Applicata Vol. XLIII,No.1 (2013) 99-107.
  • Miłosz Grodzicki, Piotr Mazur, Radosław Wasielewski, Antoni Ciszewski,Formation of Cr ohmic contact on graphitized 6H-SiC(0001) surface ,Optica Applicata Vol.XLIII, No.1 (2013) 91-98.
  • Miłosz Grodzicki, Radosław Wasielewski,Badania drgań struny,Aparatura Badawcza i Dydaktyczna 1/2012 (2012) 13-17.
  • Radosław Wasielewski, Miłosz Grodzicki,STM study of passivated Ni-6H-SiC(0001) contact at elevated temperature,2012 International Students and Young Scientists Workshop „Photonics and Microsystems”, 6-8 July 2012 Szklarska Poręba (2012) 126-128.
  • Radosław Wasielewski, Miłosz Grodzicki, Formation of ruthenium oxide chain structure on Ru(1 0 -1 0) surface as a template for study of molecules electronic properties,2012 International Students and Young Scientists Workshop „Photonics and Microsystems", 6-8 July 2012 Szklarska Poręba (2012) 123-125.
  • Piotr Mazur, Leszek Markowski, Miłosz Grodzicki,Thermal stability of LiF thin films on 6H-SiC(0001) surface,Vacuum 84 (2010) 622-624.
  • Miłosz Grodzicki, Szymon Smolarek, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Characterization of Cr/6H-SiC(0 0 0 1) nano-contacts by current-sensing AFM,Applied Surface Science 256 (2009) 1014-1018.
  • M. Grodzicki, R. Wasielewski, S.A. Surma, A. Ciszewski,Formation of Excess Silicon on 6H-SiC(0001) during Hydrogen Etching,Acta Physica Polonica A vol.116 (2009) S82-S84.
  • Miłosz Grodzicki, Jan Chrzanowski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Cr ohmic contact on an Ar+ ion modified 6H-SiC(0001) surface,Optica Applicata, VOL. XXXIX NO 4 (2009) 765-772.
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Preparation of TiO2 thin films by reactive evaporation method ,2009 International Students and Young Scientists Workshop "Photonics and Microsystems", Harz University, Wernigerode, Germany, 25-27 June, (2009) 25-27.
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Antoni Ciszewski,Preparation technique of 6H-SiC(0001) wafers,2009 International Students and Young Scientists Workshop "Photonics and Microsystems", Harz University, Wernigerode, Germany, 25-27 June (2009) 28-30.
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,Morphology and electric conductance of ultra-thin Cr contacts on 6H-SiC(0001): AFM and current-sensing AFM study,Vacuum 82 (2008) 364-371.
  • P. Mazur, M. Grodzicki, S. Zuber, A. Ciszewski,Current patterning of 6H–SiC(0001) surface by AFM ,Applied Surface Science Vol 254 (2008) 4332-4335.
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,Effects of Ar+ ion sputtering on morphology and electric conductance of 6H-SiC (0001) surface,Materials Science-Poland No. 2 (2008) 265-269.
  • Antoni Ciszewski, Miłosz Grodzicki,Current-sensing AFM Study (Electric Conductance of Ultra-thin Cr Contacts on 6H-SiC(0001)),Imaging&Microscopy 1 (2008) 2-4.
  • Miłosz Grodzicki , Piotr Mazur, Stefan Zuber, Grzegorz Urbanik, Antoni Ciszewski,Empty core screw dislocations formed on 6H-SiC(0001) during hydrogen etching,Thin Solid Films 516 (2008) 7530-7537.
  • Piotr Mazur, Stefan Zuber, Miłosz Grodzicki, Antoni Ciszewski,Basic Problems in Electrical Contact Formation on 6H-SiC(0001),International Conference Microtechnology and Thermal Problems in Electronics, MicroTherm'2007,25.06.-27.06. (2007) 243-246.