dr Piotr Mazur

Telefon: (71) 375 9444
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E-mail: login@ifd.uni.wroc.pl


Publikacje

  • Daniel Ociński, Irena Jacukowicz-Sobala, Piotr Mazur, Jerzy Raczyk, Elżzbieta Kociołek-Balawejder,Water treatment residuals containing iron and manganese oxides for arsenic removal from water – Characterization of physicochemical properties and adsorption studies,Chemical Engineering Journal 294 (2016) 210–221
  • K. Idczak, P. Mazur, S. Zuber, L. Markowski,An investigation of thin Zr films on 6H-SiC(0001) and GaN(0001) surfaces by XPS, LEED, and STM,Applied Physics A 122 (2016) 268
  • P.V. Galiy, P. Mazur, A. Ciszewski, I.R Yarovets, T.M. Nenchuk, Frank Simon, Ya.M. Buzhuk, V.L. Fomenko,The Study of Surfaces' Micro- and Nanostructure on Interlayer Cleavages of InSe Layered Crystals Intercalated by Nickel,Journal Of Nano- And Electronic Physics 8(1) (2016) 01012
  • M. Mazur, M. Kalisz, D. Wojcieszak, M. Grobelny, P. Mazur, D. Kaczmarek, J. Domaradzki,Determination of structural, mechanical and corrosion properties of Nb2O5 and (NbyCu1−y)Ox thin films deposited on Ti6Al4V alloy substrates for dental implant applications,Materials Science and Engineering C 47 (2015) 211-221
  • Radosław Wasielewski, Piotr Mazur, Miłosz Grodzicki, Antoni Ciszewski,TiO thin films on GaN(0001),Physica Status Solidi B 252(5) (2015) 1001-1005
  • P. Galiy, T. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, I. Yarovets,Scanning Tunnelling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface,Metallofizika I Noveishie Tekhnologii 37(6) (2015) 789—801
  • Michal Mazur, Torsten Howind, Des Gibson, Danuta Kaczmarek, Shigeng Song, Damian Wojcieszak, Wenzhong Zhu, Piotr Mazur, Jaroslaw Domaradzki, Frank Placido,Investigation of structural, optical and micro-mechanical properties of (NdyTi1 − y)Ox thin films deposited by magnetron sputtering,Materials and Design 85 (2015) 377–388
  • M. Grodzicki, P. Mazur, J. Pers, J. Brona, S. Zuber, A. Ciszewski,Formation of GaPd2 and GaPd intermetallic compounds on GaN(0001),Applied Physics A 120 (2015) 1443–1451
  • M. Kurnatowska, W. Mista, P. Mazur, L. Kępiński,Nanocrystalline Ce1−xRuxO2– Microstructure, stability and activity in CO and soot oxidation,Applied Catalysis B: Environmental 148-149 (2014) 123-135
  • M. Grodzicki, P. Mazur, S. Zuber, J. Brona, A. Ciszewski,Oxidation of GaN(0001) by low-energy ion bombardment.,Applied Surface Science 304 (2014) 20–23
  • M. Grodzicki, P. Mazur, S. Zuber, J. Pers, J. Brona, A. Ciszewski,Effect of annealing on Ni/GaN(0 0 0 1) contact morphology,Applied Surface Science 304 (2014) 24-28
  • Katarzyna Lament, Wojciech Kamiński, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Molecular recognition of PTCDI–C8 molecules on the Si(1 1 0)–(16 × 2) surface,Applied Surface Science 304 (2014) 50–55
  • M. Mazur, J. Domaradzki, D. Wojcieszak, D. Kaczmarek, P. Mazur,Investigation of physicochemical properties of (Ti-V)Ox (4.3 at.% of V) functional thin films and their possible application in the field of transparent electronics,Applied Surface Science 304 (2014) 73-80
  • K. Idczak, P. Mazur, S. Zuber, L. Markowski, M. Skiścim, S. Bilińska,Growth of thin zirconium and zirconium oxides films on the n-GaN(0 0 0 1) surface studied by XPS and LEED.,Applied Surface Science 304 (2014) 29-34
  • M. Grodzicki, P. Mazur, S. Zuber, J. Pers, A. Ciszewski,Pd/GaN(0001) interface properties,Materials Science-Poland 32(2) (2014) 252-256
  • F. Gołek, P. Mazur, Z. Ryszka, S. Zuber,AFM image artifacts,Applied Surface Science 304 (2014) 11–19
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,AFM/STM Modification of Thin Sb Films on 6H-SiC(0001),Acta Physica Polonica A 126 (2014) 1131
  • M. Grodzicki, P. Mazur, J. Pers, S. Zuber, A. Ciszewski,Sb Layers on p-GaN:UPS, XPS and LEED Study, Acta Physica Polonica A 126 (2014) 1128
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski ,TiO2 thin films grown on SiO2-Si(111) by the reactive evaporation method ,Optica Applicata Vol. XLIII,No.1 (2013) 99-107.
  • Miłosz Grodzicki, Piotr Mazur, Radosław Wasielewski, Antoni Ciszewski,Formation of Cr ohmic contact on graphitized 6H-SiC(0001) surface ,Optica Applicata Vol.XLIII, No.1 (2013) 91-98.
  • P.V. Galiy, T.M. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, Ya.M. Buzhuk, Indium induced nanostructures on In4Se3 (100) surface studied by scanning tunneling microscopy ,Functional Materials 20, No.1 (2013) 37-43.
  • Michał Mazur, Danuta Kaczmarek, Jarosław Domaradzki, Damian Wojcieszak, Piotr Mazur, Eugeniusz Prociow,Structural and surface properties of TiO2 thin films doped with neodymium deposited by reactive magnetron sputtering ,Materials Science-Poland 31(1) (2013) pp. 71-79.
  • P. V. Galiy, T. M. Nenchuk, A. Ciszewski, P. Mazur, Ya. M. Buzhuk, I. R. Yarovets,Nanostructural Studies of (100) Surfaces of In4Se3 Crystals Intercalated by Silver ,Metallofizika i Noveishie Tekhnologii, Vol. 35, No. 8 (2013) 1031-1o43.
  • K. Lament, P. Mazur, S. Zuber, A. Ciszewski,PTCDI-C8 Adsorption on Si(100),Acta Physica Polonica A 124 (2013) 775-776
  • R. Dylewicz, A.Z. Khokhar, R. Wasielewski, P. Mazur, F. Rahman, Nanostructured graded-index antireflection layer formation on GaN for enhancing light extraction from light-emitting diodes,Appl Phys B 107: (2012) 393-399.
  • Rafal Dylewicz, Ali Z Khokhar, Radosław Wasielewski, Piotr Mazur, Faiz Rahman,Nanotexturing of GaN light-emitting diode material through mask-less dry etching,Nanotechnology 22 (2011) 055301 (7pp).
  • P.V. Galiy, T.M. Nenchuk, O.R. Dveriy, A. Ciszewski, P. Mazur, S. Zuber, Ya.M. Buzhuk,Scanning tunneling spectroscopy of In4Se3 layered semiconductor crystals,Chem. Met. Alloys 4 (2011) 1-5.
  • Piotr Mazur, Leszek Markowski, Miłosz Grodzicki,Thermal stability of LiF thin films on 6H-SiC(0001) surface,Vacuum 84 (2010) 622-624.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska, Piotr Wieczorek, Determination of mass sensitivity of crystal quartz resonators at students' laboratory , Eur. J. Phys. 31 (2010) 257-265.
  • R. Dylewicz, R. M. De La Rue, R. Wasielewski, P. Mazur, G. Mezősi, A. C. Bryce, Fabrication of submicron-sized features in InP/InGaAsP/AlGalnAs quantum well heterostructures by optimized inductively coupled plasma etching with Cl2/Ar/N2 chemistry , J. Vac. Sci. Technol. B 28(4) (2010) 882-890.
  • Piotr Mazur, Leszek Markowski, Oxygen Influence on the Growth of Thin Hf Films on the 6H-SiC(0001) Surfaces , Surf. Interface Anal. 42 (2010) 1561 -1565.
  • Miłosz Grodzicki, Szymon Smolarek, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Characterization of Cr/6H-SiC(0 0 0 1) nano-contacts by current-sensing AFM,Applied Surface Science 256 (2009) 1014-1018.
  • P. Mazur, L. Markowski, M. Kamiński, L. Boczek,The Growth of thin Hf films on 6H-SiC(0001) surface,JSPS 141 Committee Activity Report, Proceedings of the 7th International Symposium on Atomic Level Characterization for New Materials and Devices '09, Maui, USA (2009) 543-547.
  • P.V. Galiy, T.M. Nenchuk, O.R. Dveriy, A. Ciszewski, P. Mazur, S. Zuber,Atomic force microscopy study of the cleavage surfaces of In4Se3 layered semiconductor crystal, Physica,Physica E 41 (2009) 465-469.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska,Auger electron spectroscopy for the advanced student laboratory,Eur. J. Phys. 30 (2009) 311-323.
  • P. Mazur, S. Zuber,STM and AFM study of NaCl layers on Si(100) surface,VISNYK LVIV UNIV. Ser. Physics. IS. 43 (2009) 249-254.
  • Miłosz Grodzicki, Jan Chrzanowski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Cr ohmic contact on an Ar+ ion modified 6H-SiC(0001) surface,Optica Applicata, VOL. XXXIX NO 4 (2009) 765-772.
  • P. Galiy, T. Nenchuk, O. Dveriy, A. Ciszewski, P. Mazur, S. Zuber,Nanoscale STM/STS/AFM studies of (100) In4Se3 crystal surfaces ,VISNYK LVIV UNIV. Ser. Physics. 2009. Is. 43. (2009) 28-35.
  • P.V. Galiy, A. Ciszewski, O.R. Dveriy, Ya.B. Losovyj, P. Mazur, T.M. Nenchuk, S. Zuber, Ya. M. Fiyala, Investigation of (100) In4Se3 crystal surface nanorelief,Functional Materials 16, No.3 (2009) 279-285.
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Preparation of TiO2 thin films by reactive evaporation method ,2009 International Students and Young Scientists Workshop "Photonics and Microsystems", Harz University, Wernigerode, Germany, 25-27 June, (2009) 25-27.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska, Piotr Wieczorek,Wyznaczanie czułości masowej rezonatora kwarcowego w zaawansowanej pracowni fizycznej ,Aparatura badawcza i dydaktyczna Tom XIV, Nr 3 (2009) 61-68.
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Antoni Ciszewski,Preparation technique of 6H-SiC(0001) wafers,2009 International Students and Young Scientists Workshop "Photonics and Microsystems", Harz University, Wernigerode, Germany, 25-27 June (2009) 28-30.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska, Piotr Wieczorek,Wyznaczanie czułości masowej rezonatora kwarcowego w zaawansowanej pracowni fizycznej,Aparatura badawcza i dydaktyczna Tom XIV Nr 3 (2009) 61-68.
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,Morphology and electric conductance of ultra-thin Cr contacts on 6H-SiC(0001): AFM and current-sensing AFM study,Vacuum 82 (2008) 364-371.
  • P. Mazur, M. Grodzicki, S. Zuber, A. Ciszewski,Current patterning of 6H–SiC(0001) surface by AFM ,Applied Surface Science Vol 254 (2008) 4332-4335.
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,Effects of Ar+ ion sputtering on morphology and electric conductance of 6H-SiC (0001) surface,Materials Science-Poland No. 2 (2008) 265-269.
  • P. Mazur, S. Zuber,Effects of thermal treatment on the morphology of Alq3 thin layers on Si(1 1 1) substrate,Applied Surface Science 254 (2008) 4336-4339.
  • F. Gołek, P. Mazur, Z. Ryszka, S. Zuber,Morphology of alkali halide thin films,Applied Surface Science 254 (2008) 4292-4296.
  • Miłosz Grodzicki , Piotr Mazur, Stefan Zuber, Grzegorz Urbanik, Antoni Ciszewski,Empty core screw dislocations formed on 6H-SiC(0001) during hydrogen etching,Thin Solid Films 516 (2008) 7530-7537.
  • Piotr Mazur, Stefan Zuber, Miłosz Grodzicki, Antoni Ciszewski,Basic Problems in Electrical Contact Formation on 6H-SiC(0001),International Conference Microtechnology and Thermal Problems in Electronics, MicroTherm'2007,25.06.-27.06. (2007) 243-246.
  • F. Golek, P. Mazur, Z. Ryszka, S. Zuber,Morphology of alkali halide min films studied by AFM,Surface Science 600 (2006) 1689-1696.
  • T. Greczylo, P. Mazur, E. Dębowska,A field emission microscope in an advanced students' laboratory,Eur. J. Phys. 27 (2006) 265-272.
  • P. Mazur and F. Gołek,Morphology of LiBr/LiF system studied by C-AFM,Physica Status Solidi (a) 202, 14 (2005) R155-R157.
  • P. Mazur, S. Zuber, A. Ciszewski,Tribology in nano- and mesoscale - atomic force microscopy study,Tribology Science and Application, Vienna (2004) 209.
  • F. Gołek, P. Mazur,LiF thin layers on Si(100) studied by ESD, LEED, AES and AFM,Surface Science 541 (2003) 173.
  • P. Mazur,Photoemission spectroscopy of CuCl/LiBr interface,Vacuum 63 (2001) 345.