mgr Sylwia Bilińska

Telefon: (71) 375 9275
Login: sylwiab
E-mail: login@ifd.uni.wroc.pl


Publikacje

  • Sylwia Bilińska, Karolina Idczak, Marta Skiścim, Leszek Markowski,Thin Pb films on the Si(111)-√7x√3-In reconstructed surfaces,Vacuum 122 (2015) 300-305
  • K. Idczak, P. Mazur, S. Zuber, L. Markowski, M. Skiścim, S. Bilińska,Growth of thin zirconium and zirconium oxides films on the n-GaN(0 0 0 1) surface studied by XPS and LEED.,Applied Surface Science 304 (2014) 29-34
  • Marta Skiścim, Sylwia Bilińska, Karolina Idczak, Leszek Markowski,Low coverage Si(1 1 1)√7 ×√3–In reconstruction: Deposition rate effect, Applied Surface Science 304 (2014) 103-106